These stage graticules are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same graticule in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centered on a glass disc mounted in a black anodized aluminum slide 75mm x 24mm x 2mm thick. For applications requiring traceable standards, see page 507.Two types are available:
- Transmitted light
- Reflected light, as is used with metallurgical microscopes.
A. SCALES AND MICROMETER
For Transmitted Light
- New Dual-Scale Calibration Slides
- 2” Imperial (English) and 50mm Metric Scales on a Single Slide
- Positive and Negative Versions
- Unique Serial Number for Traceability
- Available with Internationally Traceable Certificates of Calibration
EMS has introduced two new calibration slides that have the benefit of dual imperial/metric scales. The PS52P is for transmitted light applications and has a bright chrome positive image. The PS52N has a negative pattern, formed in low reflective chrome for incident light applications to give excellent contrast. Both are ideal for calibrating optical products with a large field of view, such as stereo microscopes or imaging systems.
Standard and Crossed Patterns – S1, S2, S4, S5, S8, S11, S12, S16, S20, S21, S22, S48
|PS52P||68040-05||Dual Micrometer Calibration Slide, 76mm x 25mm, positive image, 50mm in 0.1mm divisions and 2” in 0.005” divisions, serial numbered, supplied in wooden case||each||525.00||Add to Cart|
|68040-06||PS52P with UKAS certificate||each||1110.00||Add to Cart|
|PS52N||68040-07||Dual Micrometer Calibration Slide, 76mm x 25mm, negative image, 50mm in 0.1mm divisions and 2” in 0.005” divisions, serial numbered, supplied in wooden case||each||525.00||Add to Cart|
|68040-08||PS52N with UKAS Certificate||1110.00||Add to Cart|
|Pattern||Catalog||Type, Length||Nos. Div.||Div. Size||Price|
|S1||68040-01||Horizontal, 10mm||100||0.1mm||195.00||Add to Cart|
|S2||68039-02||Horizontal, 5.0mm||100||0.05mm||222.00||Add to Cart|
|S4||68039-04||Horizontal, 0.1"||100||0.001"||222.00||Add to Cart|
|S5||68039-05||Horizontal, 20mm||200||0.01mm||410.00||Add to Cart|
|S8||68042-08||Horizontal, 1.0mm||100||0.01mm||194.00||Add to Cart|
|S11||68039-11||Horizontal, 0.005"||50||0.0001"||339.00||Add to Cart|
|S12||68044-12||Horizontal, 0.1mm||50||0.002mm||339.00||Add to Cart|
|S16||68039-16||Crossed Scale, 1.0mm||100||0.01mm||275.00||Add to Cart|
|S20||68043-20||Double micrometer||10||0.01mm||308.00||Add to Cart|
|S21||68043-21||Micrometer scale||100||0.5mm||222.00||Add to Cart|
|S22||68039-22||Vertical Scale, 2.0mm||200||0.01mm||222.00||Add to Cart|
|S48||68041-48||No Coverglass, 1.0mm||100||0.01mm||222.00||Add to Cart|
Table 1: Accuracy and Line Widths of Stage Micrometers.
|S1 or PS1||0.005mm||± 0.002mm||S16 or PS16||0.0015mm||± 0.001mm|
|S2||0.005mm||± 0.00015mm||S20 or 21||0.0025mm||± 0.0015mm|
|S4 or PS4, S5 or PS5||0.002mm||± 0.0001 in||S22||0.0025mm||± 0.0015mm|
|S8 or PS8||0.002mm||± 0.001mm||S48||0.0027mm||± 0.001mm|
|S11||0.001mm||± 0.00005 in||S78 or PS78||0.003mm||± 0.001mm|
|S12 or PS12||0.001mm||± 0.001mm|
EMS is proud to introduce the S18 Brightfield Stage Micrometer: Graduated Metric and English Scales for the calibration of measurement instruments across a wide range of magnifications.
This flexible graduated scale stage micrometer is suitable for low magnification, stereo inspection microscopes to higher magnification compound microscopes.
- Dual Scales: 25mm or 1 Inch
- Graduated Divisions, fine for low magnifications, mid for medium magnifications and large for high magnifications
- High Definition, chrome on glass image
- Ideal for you if you use both metric and English measurements
The scales are centered on all glass slide 76mm x 25mm x 1.5mm thick.
|Line Width||Accuracy (overall)||Image Type|
|0.0025mm (2.5 micron)||.0.002mm||Low reflective chrome surface|
|S18||68043-30||S18 with Graticules Certificate||each||250.00||Add to Cart|
|S18||68043-35||S18 with UKAS Certificate||each||850.00||Add to Cart|
|S18||68043-40||S18 with NPL Certificate||each||1250.00||Add to Cart|
|S20||68043-20||Double micrometer scale 2mm in 0.01mm divisions and 0.1 inch in 0.005 inch divisions||each||330.00||Add to Cart|
|S21||68043-21||Micrometer scale 5mm in 0.5mm divisions, 2mm in 0.1 mm divisions, and 0.2mm in 0.01mm divisions||each||242.00||Add to Cart|
|S9||68045-09||Counting Slide 0.01mm squares.||each||235.00||Add to Cart|
|S10||68045-10||Counting Slide 0.05mm squares||each||235.00||Add to Cart|
|S28||68045-28||0.01mm grid / 0.2 x 0.2mm overall||each||248.00||Add to Cart|
|S29||68045-29||0.01mm grid / 1.5 x 1.5mm overall||each||248.00||Add to Cart|
For Reflected Light
This scale is etched through highly reflective vacuum coated metal. When viewed under vertical illumination, as with a metallurgical microscope, the scale appears black against a bright background.
Reflected light calibration slide with diamond shapes and scales for calibrating Vickers and Rockwell hardness testers
For Vickers and Rockwell methods we offer the PS25 which has a series of diamond shapes of varying size and x-y scales. Each of the markings on the slide is clearly identified with its size. The PS25 has a glass disc with the image precision marked in vacuum deposited chrome and this is cemented into a stainless steel slide mount, making the item very durable. The slide has a unique serial number indelibly marked on the slide mount and can be supplied with an Internationally traceable certificate of calibration.
PS25 Pattern Detail:
Diamonds: (Point to point, mm’s) 0.5, 0.3, 0.2, 0.1. 0.05. 0.02
Scales: Horizontal & vertical, 2mm in 0.1mm divisions
This product is supplied in a polished wooden box
|PS25||68049-05||Calibration Slide for Hardness Testers -Vickers/Rockwell||each||340.00||Add to Cart|
|PS25||68049-06||PS25 with UKAS certificate||each||1100.00||Add to Cart|
Reflected light calibration slide with circle shapes and scales for calibrating Brinell hardness testers
For Brinell methods we offer the PS26 which has a series of circles, to represent the ball indentation shape, of varying size and x-y scales. The PS26 has a precision marked chrome deposition image on a glass slide. Each of the markings on the slide is clearly identified with its size. The slide can be supplied with an Internationally traceable certificate of calibration. This product is supplied in a polished wooden case.
PS26 Pattern Detail:
Circles: (Diameter, mm’s) 5.0, 2.5, 1.0, 0.7, 0.3
Scales: Horizontal & vertical, 2mm in 0.1mm divisions
|PS26||68049-15||Calibration Slide for Hardness Testers - Brinell||each||340.00||Add to Cart|
|68049-18||PS26 with UKAS certificate||each||1100.00||Add to Cart|
Reflected light stage micrometer with 0.1” scale subdivided into 0.001” divisions
Line width: 0.002mm
Accuracy (overall): <0.0001”
|S4R||68047-4R-GR||S4R with Graticule certificate||each||660.00||Add to Cart|
|S4R||68047-4R-NA||S4R with UKAS certificate||each||705.00||Add to Cart|
|S4R||68047-4R-NP||S4R with NPL Certificate||each||1400.00||Add to Cart|
Reflected light calibration slide with 0.1” length scale subdivided into 0.001” divisions
PS4R — shown in box
|PS4R||68047-PS4R||Micrometer Scale 0.1inch in 0.001 inch divisions for reflected light||each||275.00||Add to Cart|
|PS4R||68047-PS4R-GR||PS4R with Grats certificate||each||595.00||Add to Cart|
|PS4R||68047-PS4R-NA||PS4R with UKAS certificate||each||675.00||Add to Cart|
|PS4R||68047-PS4R-NP||PS4R with NPL Certificate||each||1300.00||Add to Cart|
|S78||68043-78||Micrometer scale 1mm in 0.01mm divisions.||237.00||Add to Cart|
Green Float glass, high reflective Chrome image
The ideal product for testing image area, distortion, field flatness and other parameters in optical and imaging systems. The three array areas give options for different magnifications or field size.
The R76, a unique product with three dot arrays to suit different magnification or image areas.
3 image areas, Dot size and pitch different in each area
- 12 x 9 array of 1mm dots at 5mm pitch
- 16 x 12 array of 0.5mm dots at 2mm pitch
- 24 x 18 array of 0.2mm dots at 1mm pitch
|68073-R76||Grid Dot Array, 3 image areas||101x101x2.2mm||each||440.00||Add to Cart|
B. STAGE CALIBRATION STANDARDS
These stage micrometers differ from the standard stage micrometers due to the fact they are being available with a certificate giving precise details about their accuracy. These calbrated standards provide traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, which is necessary under ISO provisions.
These standards are differ from the stage micrometers listed in the pevious section. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case to distinguish it as a traceable standard of high value. We can arrange for the calibration of its scales and grids to be carried out by the most appropriate laboratory to suit the customers requirements – the choice of laboratory is normally dependent on the nature of the calibration and the accuracy required.
- Calibration by NPL: The National Physical Laboratory carries out measurements at selected points on the scale and grids and issues a certificate of calibration. Order Code NP. The NPL is the English equivalent of NIST.
- Calibration by UKAS accredited laboratory: A UKAS accredited laboratory carries out measurements at selected points on the scales and grids and issues a calibration certificate. Order Code: NA
- Measurement by Pyser-SGI, Graticules Division: For applications, which do not require the accuracy or traceability provided by calibrations carried out by NPL or a UKAS accredited laboratory, We can provide a Certificate of Comparison. The scale or grid is compared with NPL calibrated in-house standards and a statement is provided on the accuracy of the item with respect to these standards. Order Code GR
|PS1||68047-1GR||PS1 with Graticules Certificate||620.00||Add to Cart|
|68047-1NA||PS1 with UKAS Certificate||690.00||Add to Cart|
|68047-1NP||PS1 with NPL Certificate||each||1,190.00||Add to Cart|
|PS4||68047-4GR||PS4 with Graticules Certificate||625.00||Add to Cart|
|68047-4NA||PS4 with UKAS Certificate||705.00||Add to Cart|
|68047-4NP||PS4 with NPL Certificate||each||1,400.00||Add to Cart|
|PS4R||68047-PS4R-GR||PS4R with Grats Certificate||535.00||Add to Cart|
|68047-PS4R-NA||PS4R with UKAS Certificate||600.00||Add to Cart|
|68047-PS4R-NP||PS4R with NPL Certificate||each||1250.00||Add to Cart|
|PS5||68047-5GR||PS5 with Graticules Certificate||725.00||Add to Cart|
|68047-5NA||PS5 with UKAS Certificate||825.00||Add to Cart|
|68047-5NP||PS5 with NPL Certificate||each||1,500.00||Add to Cart|
|PS8||68047-8GR||PS8 with Graticules Certificate||625.00||Add to Cart|
|68047-8NA||PS8 with UKAS Certificate||705.00||Add to Cart|
|68047-8NP||PS8 with NPL Certificate||each||1,400.00||Add to Cart|
|PS12||68047-12GR||PS12 with Graticules Certificate||790.00||Add to Cart|
|68047-12NA||PS12 with UKAS Certificate||1,350.00||Add to Cart|
|68047-12NP||PS12 with NPL Certificate||each||1,575.00||Add to Cart|
|PS16||68047-16GR||PS16 with Graticules Certificate||780.00||Add to Cart|
|68047-16NA||PS16 with UKAS Certificate||1050.00||Add to Cart|
|68047-16NP||PS16 with NPL Certificate||each||2400.00||Add to Cart|
|PS78||68047-78GR||PS78 with Graticules Certificate||660.00||Add to Cart|
|68047-78NA||PS78 with UKAS Certificate||750.00||Add to Cart|
|68047-78NP||PS78 with NPL Certificate||each||1,400.00||Add to Cart|
|68047-C||UKAS Certification for SI - S70||400.00||Add to Cart|
|68047-Cert||NPL Certification for SI - S70||1,000.00||Add to Cart|
This high precision image analysis standard provides four test areas designed
for calibrating image analysis systems and identifying deviations and distortions
in optical imaging systems.
The standard, which can also be used as a high precision stage micrometer, is supplied with recommendations for its use and an individual certificate of calibration.
It is produced on a 75mm x 25mm slide and has a square grid accuracy of ±0.1µm and a dot accuracy of ±0.3µm (except for the smallest and largest two dots on the root-2 array, where accuracy is ±0.5µm). The four test areas are:
- 400µm x 400µm square grid which is subdivided into 200, 100, 50 and 25 micron squares provides a means of detecting gross image distortions, and can be used as an accurate two dimensional stage micrometer.
- A 20 x 17 array of nominally 15µm diameter dots can be used to identify lens distortions. i.e. to set the field of view to eliminate edge distortion.
- A root-2 array of spots from 3µm to 48µm diameter is used for determining the threshold levels of cameras and microscope systems.
- A log-normal distribution array of 100 spots ranging from 4.5µm to 27µm diameter enables the mean and standard deviation to be determined and compared with the certified values. This is an idealized distribution of maximum dynamic range for a full screen.
|68049||Reference stage graticule 75mm x 25mm slide.||3,600.00||Add to Cart|
Calibration of microscopes and image analysis systems is becoming more sophisticated, with the requirement being for a variety of image patterns to satisfy the numerous parameters. We’re now introducing a new multi-function calibration standard specifically for these applications.
Multiple images on a slide provide the most cost-effective solution to calibration and resolution checking of microscopes and image analysis systems. The combination of scales, dots, circles, squares, rulings, grids and angles can be supplied with an internationally traceable certificate of calibration for those who require ISO conformity.
Each glass slide has a permanent serial number and can be supplied with full or partial UKAS certificate of accuracy.
Starting from a fixed ‘Datum Point’ mark, each individual pattern or array can be located using X, Y, coordinates.
General tolerance (microns)
|Feature size||≤ 10||10 - 50||50 - 127||127 - 250||>250|
|Coating||Enduring evaporated chrome image|
|Substrate||Soda lime glass|
|Size||76 mm x 25 mm x 1.5 mm|
|Package||Polished wooden case|
PS20 Universal Calibration Slide Image Details
|A||Concentric Circles||X =2;
Y = 10
|1, 2, 3, 4, 5 mm Circles with
Cross Line & circle identifier.
Line width 20µm
|1, 2, 3, 4, 5 mm Squares with Cross Line & circle identifier. Line width 20 nm|
|12.5 Line Pairs per mm (40µm line 40µm space)|
|50 Line Pairs per mm (10µm line 10µm space)|
|15 Spacing, Line width 20µm|
|F||Grid Array Coarse||X=40;
|5 mm square array with 0.5 mm divisions and central 2 mm square with 0.25 mm divisions. Line width 20µm|
|G||Grid Array Fine||X=48;
|5 mm square array with 0.1 mm divisions and central 2 mm square with 0.05 mm divisions. Line width 8µm divisions and central 2 mm square with 0.05 mm divisions. Line width 8µm|
|Dot diameter 0.25 mm, dot centre to centre spacing 0.050 mm – 11x11 grid = 121 dots to centre spacing 0.050 mm – 11x11 grid = 121 dots|
|I||Geometric progression of Opaque Dots||X=2;
|Line array of dots or square shapes, of either clear or opaque. Reducing in size in a Root 2 progression for the purposes of edge threshold detection to enable an image analyzer to measure the size correctly, or general shape size comparison.|
|Root 2 progression of 21 dots or square shapes, from 3.5µm to 3.5µm.|
|K||Geometric progression of Clear Dots||X=32;
|Nominal size in mm|
|L||Geometric progression of Clear Squares||X=47;
|Dot/square size – Large to small in mm 3.5833; 2.5338; 1.7917; 1.2669; 0.8959; 0.6335; 0.4479; 0.3167; 0.2240; 0.1584; 0.1120; 0.0792; 0.0560; 0.0396; 0.0280; 0.0198; 0.0140; 0.0099; 0.0070; 0.0049; 0.0035|
|M||Vertical Scale Fine Variable||X=63||Overall Scale length 10 mm.
5 mm in 0.5 mm divisions. Line width 20µm
4 mm in 0.1 mm divisions. Line width 10µm
1 mm in 0.01 mm divisions. Line width 3 µm
|Scale length 62 mm in 2 mm
Scale Coarse divisions, subdivided in 1 mm divisions with a 20µm line width.
|PS20||68053-20||Universal Calibration Slide PS20||each||275.00||Add to Cart|
This test slide is made in the UK and is under license from the National Physical Laboratory. It is an epoxy replica of a master slide produced and certified by that laboratory. The replicas are mounted on microscope slides of 1.2mm thickness with cover glass of 0.17mm thickness. This information is transferred to the accompanying table, which indicates the maximum phase change passing through test objects to test slide. A satisfactory system will detect block 5. Full details are supplied with the slide.
|S84||HSE Test Slide for Calibration in Asbestos Analysis||68038-84H||1,550.00||Add to Cart|
The pair of dots, which appear to merge into a single dot, determines the amount of vibration of the slide in the appropriate axis. The pattern on the S25 is an array of 20 pairs of dots converging on a single dot. The distance between each dot pair increases by 0.001 inch to a maximum of 0.02 inch, pairs being squispaced 0.25 inch.
|S25||68038-25||Foepple Dot Vibration Test||290.00||Add to Cart|
These are used to create precise volumes of liquid to enable counting of particles in a specified volume of liquid. A thick slide (glass or plastic) has an area cut into its surface that will hold precise volumes of bathing fluid. The shallow well, facilitating easy counting of contained particles. In use, a single drop of liquid is placed on the slide and a coverglass is placed on the platform providing equal and accurate subdivisions of the fluid each of which can be observed for particle counting.
For use in water analysis, culture inspection, and any fluid where particles
per unit volume need to be determined. Available in two versions:
S50 is an economically priced plastic cell.
S52 is made from glass, with a chromium surface image. This is intended for professional use and when using phase contrast. In each type, a central cell is filled with fluid and a coverglass limits the volume to 1 milliliter. The grid subdivides this into micro-liters.
S51 is the spare cover glass for S50 and S52. Each cell is supplied with one cover glass.
|S50||68050-50||S50, Sedgewick Rafter, Plastic||each||51.00||Add to Cart|
|S52||68050-52||S52, Sedgewick Rafter, Glass||each||250.00||Add to Cart|
|S51||68050-51||S51, Cover Glass for S50 & S52||each||15.00||Add to Cart|
The Howard cell is a glass slide 76mm x 35mm with a central circular island and is used for counting mold fibers and spores in fruit juices, especially from tomatoes. With the K20 coverglass in place a 0.1mm thickness of liquid is contained over the central island. The coverglass has 25 calibrated fields of 1.382mm diameter through which to view the particles. This coverglass removes the necessity of precise adjustment of the microscope and eyepiece graticule in the original Howard method.
|S60||68051-60||Howard Cell for Fruit Juices||each||340.00||Add to Cart|
|K20||68051-20||K20 Calibrated Cover Glass||each||100.00||Add to Cart|
Finder graticules are used to swiftly and accurately give a position of reference to an area of interest on a specimen.
S7 is a glass slide 75mm x 26mm (3x1") marked over the top surface in a way that a referenced position can be directly read relative to the locating edges. That means it is marked with a square grid at 1mm intervals. Each square contains a center ring bearing reference letters and numbers, the remainder of the square being subdivided into four segments numbered 1 to 4.
Reference numbers run horizontally 1 to 75 and letters vertically A to Z (omitting I) The main locating edge is the bottom of the slide, which is used in conjunction with either the left or right vertical edge of the slide.
All England Finders produced for over 40 years are identical. The purpose of the finder is to give the microscopist an easy method of recording the position of a particular field of interest, so that another person in another laboratory can relocate at a later date, or the same position, or when using any other England Finder on any other microscope.
The location of the arrows is identical for all England Finder slides. Mark a label on the left hand side of the specimen slide, indicating the orientation to be repeated. By replacing the specimen slide with England Finder, taking care not to disturb the position, feature of interest can be noted. The feature can also be re-located at another place or time by reversing the procedure. A total of 100 positions on a slide can be accurately located.
|S7||68048-07||The England Finder||each||250.00||Add to Cart|
For Rapid Semen Analysis – The Makler counting chamber is only 10 microns deep, which is one tenth the depth of other hemacytometers., making it the shallowest of known chambers. This quality chamber is constructed from two pieces of optically flat glass: the first is the chamber, the second is the cover glass, which has a fine grid pattern of 1mm squares and a center area further subdivided into 0.1mm squares. Four quartz pins of precise height hold the cover glass to give an exact trapped specimen depth of 10 microns.
|68052-01||Makler Counting Chamber||each||1,695.00||Add to Cart|
We have now simplified the way in which you order The Eyepiece Graticule/Stage
Micrometer Sets to suit your application, Simply select the objective magnification
on the microscope, and then look in the next column to find the measurement
size range that suits you best. You then find the set order reference and
the description for your calibration set.
Please state the eyepiece graticule diameter on your order.
Combinations Without Certification
|For Transmitted Light|
|68060-05A||0.5||0.1-10mm||NE5, 5mm in 0.05mm||S1, 10mm in 0.1mm|
|68060-05B||0.5||0.01-1mm||NE28, 1mm in 0.01mm||S8, 1mm in 0.01mm|
|68060-1A||1||0.1-10mm||NE1, 10mm in 0.1mm||S1, 10mm in 0.1mm|
|68060-1B||1||0.01-1mm||NE28, 1mm in 0.01mm||S8, 1mm in 0.01mm|
|68060-2A||2||0.1-10mm||NE5, 5mm in 0.05mm||S1, 10mm in 0.1mm|
|68060-2B||2||0.01-1mm||NE5, 5mm in 0.05mm||S8, 1mm in 0.01mm|
|68060-4||4||0.01-1mm||NE5, 5mm in 0.05mm||S8, 1mm in 0.01mm|
|68060-10A||10||0.01-1mm||NE1, 10mm in 0.1mm||S8, 1mm in 0.01mm|
|68060-10B||10||0.002-0.1mm||NE28, 1mm in 0.01mm||S12, 0.1mm in 0.02mm|
|68060-16A||16||0.01-1mm||NE1, 10mm in 0.1mm||S8, 1mm in 0.01mm|
|68060-16B||16||0.002-0.1mm||NE5, 5mm in 0.05mm||S12, 0.1mm in 0.02mm|
|68060-20A||20||0.01-1mm||NE1, 10mm in 0.1mm||S8, 1mm in 0.01mm|
|68060-20B||20||0.002-0.1mm||NE5, 5mm in 0.05mm||S12, 0.1mm in 0.02mm|
|68060-40A||40||0.01-1mm||NE1, 10mm in 0.1mm||S8, 1mm in 0.01mm|
|68060-40B||40||0.002-0.1mm||NE5, 5mm in 0.05mm||S12, 0.1mm in 0.02mm|
|68060-60||60||0.002-0.1mm||NE1, 10mm in 0.1mm||S12, 0.1mm in 0.02mm|
|68060-100||100||0.002-0.1mm||NE1, 10mm in 0.1mm||S12, 0.1mm in 0.02mm|
|For Reflected Light|
|68062-10||10||0.1-1mm||NE1, 10mm in 0.1mm||S78, 1mm in 0.01mm|
|Catalog #||Without Certificate||With Certificate|
|68061-05A||Transmitted Light||330.00||Add to Cart||585.00||Add to Cart|
|68061-05B||Transmitted Light||360.00||Add to Cart||660.00||Add to Cart|
|68061-1A||Transmitted Light||320.00||Add to Cart||660.00||Add to Cart|
|68061-1B||Transmitted Light||460.00||Add to Cart||660.00||Add to Cart|
|68061-2A||Transmitted Light||320.00||Add to Cart||580.00||Add to Cart|
|68061-2B||Transmitted Light||310.00||Add to Cart||580.00||Add to Cart|
|68061-4||Transmitted Light||320.00||Add to Cart||580.00||Add to Cart|
|68061-10A||Transmitted Light||320.00||Add to Cart||660.00||Add to Cart|
|68061-10B||Transmitted Light||480.00||Add to Cart||1000.00||Add to Cart|
|68061-16A||Transmitted Light||320.00||Add to Cart||610.00||Add to Cart|
|68061-16B||Transmitted Light||460.00||Add to Cart||985.00||Add to Cart|
|68061-20A||Transmitted Light||320.00||Add to Cart||660.00||Add to Cart|
|68061-20B||Transmitted Light||460.00||Add to Cart||985.00||Add to Cart|
|68061-40A||Transmitted Light||320.00||Add to Cart||660.00||Add to Cart|
|68061-40B||Transmitted Light||485.00||Add to Cart||1000.00||Add to Cart|
|68061-60||Transmitted Light||485.00||Add to Cart||1000.00||Add to Cart|
|68061-100||Transmitted Light||470.00||Add to Cart||1,225.00||Add to Cart|
|68063-10||Reflected Light||375.00||Add to Cart||560.00||Add to Cart|
|68065-B||Asbestos (at X40)||Basic Kit -- Comprises S12 stage micrometer (1mm in 0.01mm) + Walton & Beckett graticule with UKAS Certificate of Calibration.||1150.00||Add to Cart|
|68065-S||Super Kit||As per Basic Kit, but with S84 phase contrast test slide.||2200.00||Add to Cart|
|68066||Designed for use with multiple objective microscopes. Comprises NE1 Eyepiece graticule + S1 stage micrometer + S12 stage micrometer.||600.00||Add to Cart|