30mm x 5mm Carbon Block
Checks Detector and SEM Performance.
Certified Standards For System Calibration.
- Standards to check 1 Atomic number resolution.
- Faraday Cup to set probe current.
- Duplex Brass to check 0.1 Atomic number resolution
|80070-BED||Backscattered Electron Detector||each||1875.00||Add to Cart|
In 13mm Aluminium pin stub certified standards for system calibration. Diamond polished to 0.25um surface finish. Carbon Coated.
This standard allows user to go across all grey areas.
|80070-EBP||Electron Backscatter||each||900.00||Add to Cart|
|80086-28||Geological/Silicate Material Block||each||2900.00||Add to Cart|
|W||Zircon Beam Locate|
|80086-30||Sulphide Minerals / Oxide Heavy Metals Standards Block||each||3100.00||Add to Cart|
A new product that allows the user of the Scanning Electron Microscope to check the performance of their instrument to make sure that it is working within the manufactures specification.
A useful tool to all Scanning Electron Microscope users such as Researchers, Technologists, Quality Assurance Departments, and SEM users with Energy Dispersive or Wavelength Dispersive X-ray systems fitted, because it enables them to readily assess the state of their instrument.
Co (Cobalt) is compulsory for checking Energy Dispersive analyzers. The customer can choose any other five from our lists, with the exception of the SRM 481, SRM 482 and SRM 1872.
2. Duplex Brass
Used for checking the contrast efficiency of Back Scattered detectors and it is capable of detecting two major copper/zinc phases of 0.1 atomic number difference.
3. Faraday Cage
A Faraday cage is used for measuring the current of the beam at the specimen plane. The beam of electrons is focused inside the hole by increasing the magnification so that when the hole fills the screen all the electrons are trapped and a true measure of current is achieved. The Hole size in FC `aperture' - 150 microns.
Is a sample of gold crystals on a carbon background which is useful for checking the performance of the SEM under high-resolution conditions i.e. finer than a 10 micron probe.
Silicon test specimen with squares of periodicity 9.9 micrometers lines about 1.9 micrometers wide which has formed by electron beam lithography - used for magnification calibration and assessing image distribution.
All items 1 through 5 above (QCT A) can be mounted on a block 25mm diameter x 5mm thick
|80150-25||Quality Control Test Set A||set||2,500.00||Add to Cart|
Quality Control Test Set B
A larger version of the above is available with the following additions:
- S168U Gold on Carbon used for low KV resolution check.
- 1000 mesh and a 2000 mesh grid for magnification calibration of Scanning Electron Microscope.
This larger (QCT B) version is mounted on a brass block 32mm diameter x 5mm thick.
|80150-32||Quality Control Test Set B||set||3,145.00||Add to Cart|
The Standard Test Specimen keeps the Scanning Electron Microscope up to peak operating conditions. It is available in three model:
- Three formats:
- 32mm diameter brass block consisting of 6 standards. One being Cobalt the remainder is the customer's choice. (see list)
- Faraday cage.
- B.S.D. Duplex Brass Reference Standard at No. difference 0.1.
- Resolution Grid either High or Medium.
- Test Specimen for Magnification Calibration.
- Certificate booklet.
|80154-00||Standard Test Specimen||Set||2,312.00||Add to Cart|
Custom Made to Your Choice!
The Sample Holder is perfect for keeping all important SEM test specimens together. All specimens can be individually and easily removed at any time for use.
The brass sample holder is 50mm diameter x 8mm thick and comes in MAC's standards presentation box.
It accommodates the following:
- A 25mm or 32mm diameter x 5mm thick brass block containing your Analytical Standards, or other smaller sizes if required.
- Duplex Brass Single Standard Used for checking the contrast efficiency.
- Ni/Cu B.S.D. Single Standard.
- Faraday Cage
For measuring the current of the beam at the specimen plane.
- E.D. Test Standards
Three standards of your choice for E.D. test set up of calibration center.
- Magnification Calibration Standard
Used for magnification calibration and assessing image distortion.
- Resolution Standards
High and Low resolution standards for checking the performance of the S.E.M. under high resolution conditions.
|81055-00||SEM Custom Sample Holder||P.O.R||Quote|