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Technical Data Sheets

STEM Holder, JEOL Model

EMS Catalog #75954-02

The STEM Holder enables one to obtain a transmitted electron image in a SEM. It is designed so that the primary electron beam passes through a thin specimen and falls on a platinum “reflector”. The beam is scattered by the specimen and the secondary electron detector collects the secondary electrons produced by the transmitted beam at the platinum surface. A slit aperture is interposed between the specimen and the reflector to reduce noise.

To use:

1. Remove the Teflon collar and the brass cap from the grid holder. Place the grid, specimen side up, onto the tip of the holder. Center it carefully. Replace the cap and Teflon collar.
2. Insert the STEM Holder into the microscope so that the platinum reflector faces the secondary electron detector.
3. Raise the specimen stage up (Z direction) so that the top of the Teflon collar is as close as possible to the pole piece of the microscope. This will shield the detector from most of the secondary electrons emitted by the sample.
4. Focus the transmitted image. Only the grid area directly over the slit aperture will be a true transmitted image. By careful adjustment of the X, Y and tilt controls, all of the grid openings can be brought to a position above the slot grid opening.
5. In the transmitted mode, grid bars should be dark and grid openings lighter. Check to see that you have obtained the transmitted image. Observe the CRT as you rotate the device to face away from the detector. A transmitted image will grow dark and very faint.  If it does not, you have been viewing a conventional scanning image. Raise the holder still further so that the Teflon collar is closer to the pole piece.

Online Ordering

STEM Holder, JEOL Model is available online from the EMS Catalog. For ordering or product information, click here.