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Electron Microscopy Sciences

Calibration Standards, Specimens, and Aids

arrow13Low Magnification Calibration Standards

Available for SEM and LM

Silicon Test Specimenarrow11Silicon Test Specimen

This Test Specimen is made of a 5mmx5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide.

A broader etching line is written every 500µm, which is useful in light microscopy. This is an excellent test specimen for comparing magnification and assessing any distortion in the image field. It is ideally useful in the context of automated counting systems to check for unsuspected distortions. Where critical measurements must be made the sample can be mounted directly onto the calibration specimen so that an internal calibration is obtained on the micro-graph.

Example Certificate of Calibration

79502-01 Silicon Test Specimen, Unmounted each 80.00 Add to Cart
79502-10 Silicon Test Specimen, Unmounted 10/pk 785.00 Add to Cart
79502-12 Silicon Test Specimen on 12.5mm Pin Stub each 99.00 Add to Cart
79502-20 Silicon Test Specimen for Incident LM each 156.00 Add to Cart
79502-30 Calibration Certificate each 317.00 Add to Cart

SEM Calibration Specimens arrow13arrow13