FIB Supplies

FIB instrumentation resembles SEM but utilizes a focused beam of ions rather than electrons. This technique is used particularly in materials science (i. e. semiconductors) but also increasingly in life sciences for site-specific analysis, deposition, and materials ablation. FIB and SEM can be incorporated in the same system (SEM/FIB), allowing comparative imaging of the same sample. 

EMS carries a full range of FIB supplies for milling cross sections and TEM samples, including Omniprobe AutoProbe™ Lift-out Grids and Tools, Carb-N-Grids™, and FIB Grid Holders.


Lift Out Grids

Lift-out Grids from EMS are meant for FIB applications, including accepting lamellae prepared by FIB or FIB-SEM systems. EMS offers Lift-out Grids, such as Omniprobe Lift-Out Grids and Carb-N-Grids. The Omniprobe Copper 5-Post Lift-Out Grids feature low profile sides, five post copper lift-out grids designed explicitly for in-situ lift-out, and multiple indexed mounting locations. The Carb-N-Grids™ 2 & 4 Post 3mm Lift-Out Grids are a durable carbon lift-out grid that facilitates precise Elemental Analysis.


FIB Supplies