Mechanically prethins specimens for transmission electron microscopy (TEM). Greatly reduces the time spent during the final preparation process of ion beam milling.
Description
The Model 160 Specimen Grinder is an accurate and dependable tool for mechanically prethinning specimens in preparation for transmission electron microscopy (TEM). The grinder accommodates up to 18 mm diameter specimens.
The specimen grinder greatly reduces the time spent during the final preparation process of ion beam milling, which is typically used to achieve electron transparency.
A graduated scale allows the specimen thickness to be easily and precisely controlled; rotating the control knob advances the specimen 0.5 mm per rotation.
The large diameter provides excellent stability. Specimens with uniform thickness and parallel sides are consistently produced because of the precise fit of the specimen platen into the grinder body. The grinder is heavy enough to provide sufficient grinding force on the specimen.
Features
- Accurate and dependable
- Precisely controlled
- Specimens up to 18 mm diameter
- Large diameter provides excellent stability
- No additional force needed
- Consistently produce specimens with uniform thickness and parallel sides
- Platen transferable to the Model 200 Dimpling Grinder
One-step mounting
If further thinning via dimpling is required, the platen containing the specimen is simply ejected from the specimen grinder and installed directly into the Model 200 Dimpling Grinder.
This eliminates any possibility of damaging the specimen by demounting it for dimpling.
Specifications
| Specimen Size |
Up to 18 mm diameter |
| Dimensions |
3.0 in (76 mm) diameter x 2.6 in (66 mm) height |
| Weight |
All program inputs via front panel keypad, Specimen thickness indicated on a liquid crystal display |
| Warranty |
One year |
Model 160 Specimen Grinder includes
- Platen, 0.75" Diameter (4)
- Platen Holder