Reference standards are used for a variety of speciﬁc assessment purposes and are crucial for maintaining the accuracy and reliability of SEM imaging and analysis. Available in a variety of materials and types dependent on their speciﬁc application, reference standards can be employed to calibrate SEMs and evaluate their performance in the areas of resolution, magniﬁcation, composition, contrast, and more.
30mm x 5mm carbon block that checks detector and SEM performance. Certified standards for system calibration. Contains standards to check 1 atomic number resolution, Faraday cup to set probe current, and Duplex brass for 0.1 atomic number resolution.
In 13mm Aluminium pin stub certified standards for system calibration. Diamond polished to 0.25um surface finish. Carbon Coated. This Electron Backscatter Particle Analysis standard allows user to go across all grey areas.
Scanning Electron Microscope with 6 standards (Cobalt and five customer's choices), Faraday cage, BSD Duplex Brass Reference, high or medium resolution grid, specimen for magnification calibration, certificate.