Cross line pitch spacing of 463nm with 2160 lines/mm in both directions, cross at 90° for additional accuracy to magnification and aid in distortion checks. Trench-type groove to measure pitch. For electron microsocpe magnification to 80000/100000.
Measuring and correcting astigmatism and for evaluating the resolution of the transmission electron microscope. A thin film of carbon has been treated to obtain numerous round holes of various sizes, on a 3.05mm copper grid.
Latex particles with 0.261um diameter are shadowed with a coating of gold. Measure the finest migrated gold particle in the shadow to determine the resolution of the STEM. Mounted on formvar/carbon film copper grid.
Calibration specimens for TEM and STEM. Resolution of the quad structure of this molecule indicates an instrument resolution better than 1.25nm with a photomicrograph negative magnification of at least 100,000x.
Holey carbon film is shadowed with gold and graphitized carbon particles are deposited on a grid. The gold forms small polycrystalline islands and in which lattice fringes can be used to assess microscope performance.
Ion milled cross section of a silicon single crystal for all major TEM calibrations. Calibration structure is viewed in a TEM, it appears as a series of light and dark layers where the layer thicknesses are accurately known.