Ideal for examination cross section of thin samples, such as wafers,
multi-layer of capacitors, plastics, metals, etc.
- For most AMRAY: ½" diameter (12.7 mm), ⅛" (3.1 mm)dia. pin (3.1 mm)
with split openings up to ¼" (6.4 mm). Available with either 8 mm
(5/16") pin height or 15 mm (9/16") pin height.
- For ISI, JEOL, TOPCON: Double set screw for a secure holding of the
specimen during observation. 15 mm (9/16")(dia). x 10 mm (3/8")(H), 6.4 mm (1/4")
split.
For ISI, JEOL, TOPCON: double set screw for a secure holding of the specimen during observation. 15mm(dia). X 10mm(H), 6.4mm split