Image Analysis Micro Line/Dot Standard
A standard specifically designed to calibrate CCD, CMOS devices and other geometric measuring imaging systems where critical measurement is important. Electronic sensors often have spurious resolution created by pixel dithering. The IAM-6 limits this calibration problem by providing known dot and line sizes to test the sensor/optical capabilities.
||1" x 3" (25 mm x 75 mm)
||Positive image/Chrome on glass (PG)