The Gatan 3View systems use special sample pins. These are used inside SEMs to create 3D imaging data of samples by serial slicing and BSD imaging. The sample pins are offered with two sample areas:
- Standard 1.4 mm flat sample area
- Larger 2.4 mm flat sample area
These pins are fully compatible with the Gatan 3View systems; 2 mm pin, 3 mm head with cone top and total height of 12.5 mm. Manufactured from vacuum grade aluminium.
When you need a special Gatan 3View sample stub, which is not offered on our website, please contact us. We can manufacture custom sample stubs or might be able to suggest a solution with alternative sample stubs.