Low Magnification Finder Grid Substrate

For use with SEM, FIB, XPS/ESCA, Auger, and LM.

This conductive silicon substrate is marked by DRIE and features a (144) 1 x 1 mm alphanumeric field defined by 5 µm deep x 20 µm wide trenches.

  • Combines the qualities of a flat specimen support and an SEM finder grid
  • Same low background signal as silicon chips
  • Easily mounts to most popular sizes of SEM sample stubs

Specifications

Die Size 12.5 mm x 12.5 mm
Substrate Size 20 mm x 20 mm
Material Prime Virgin Silicon Wafer, P Boron Dropped
Thickness 645 µm ± 55 µm
Orientation <100>
Resistivity 0.5-35 ohm/cm
SKU: 80104-01
Pack: Each
$25.50