Double 1/2" FIB Sample and Grid Holder, Pin

Holds a FIB sample mounted on two standard ½" (12.7 mm) pin stubs for FIB milling and lift-out procedures. Conveniently holds two FIB grids close to the sample to mount prepared TEM lamellae on the FIB grid for TEM imaging. Cost-effective holder suitable for all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems. For the JEOL and Hitachi systems, use a pin mount adapter.

Overall Dimensions: 36.5 x 12.7 x 11.6 mm (1.44" x 0.5" x 0.46").

Pin: Standard 3.2 mm (⅛").

Material: Vacuum grade aluminum with brass screws.

Includes Philips screwdriver #0.

SKU: 75950-04
Pack: Each