Model IAM-8
Multi-Grid Image Analysis Standard
A uniquely designed standard with 4 different grid size patterns: 0.5 x 0.5 mm grid with 25 µm pitch; 1.0 x 1.0 mm grid with 50 µm pitch; 2.0 x 2.0 grid with 100 µm pith; and 4.0 x 4.0 mm grid with 200 µm pitch. Also includes a Star Target with 15 degree angle increments. This standard can be used to test not only the overall frame distortion issue, but also linear distances for a wide variety of magnification ranges from 1x to 1,000x power.
Specifications
| Overall Size |
1" x 3" (25 mm x 75 mm) |
| Image |
Positive image/Chrome on glass (PG) |