MAC’s range of Quality Control Test Standards (QCT) have been thoughtfully designed and manufactured to help aid the user in checking and monitoring the performance and accuracy of their EDX/WDX-SEM equipment and to help identify any potential problems that may effect the quality of the analysis results they are achieving.
MAC standards are used worldwide by:
- OEM Engineers in the setup and servicing of equipment
- Testing Laboratories
- Research & Development Laboratories
- Universities, Colleges and Schools
- Geological Societies
- Police Forensic Science Departments
- Government Agencies
All of the QCT standards we manufacture can be customized by the customer if an alternative material or accessory is preferred or required. If we do not have the material you need from the 1,000+ materials available, we will do our best to source it for you.
Supplied in a specially designed storage/transportation case that contains:
- The standard—protected by an additional specially designed case
- A full electronic booklet on a USB, containing:
- The standard plan/layout
- Certificates of analysis or conformance for each material
- Details on storage and care of your standards
- Certificate of final inspection & recommended re-polishing date
- A replaceable silica gel capsule for protection whilst in transit
- A credit card sized quick reference guide
Quality Control Test Standard B consists of:
1. Standards: Co (Cobalt) is compulsory for checking Energy Dispersive analysers. The customer can choose any other five from our lists, with the exception of the SRM 481, SRM 482 and SRM 1872.
2. Duplex Brass: Used for checking the contrast efficiency of Back Scattered detectors and it is capable of detecting two major copper/zinc phases of 0.1 atomic number difference.
3. Faraday Cage: A Faraday cage is used for measuring the current of the beam at the specimen plane. The beam of electrons is focused inside the hole by increasing the magnification so that when the hole fills the screen all the electrons are trapped and a true measure of current is achieved. The Hole size in FC “aperture” - 150 microns.
4. Silicon Magnification Grid: Silicon test specimen with a pitch of 10 μm and lines at 10 and 100μm. Useful for calibration and image distortion checks in the 100x to 1000x magnification range
5. BSE Atomic No. Reference: Silicon test specimen with a pitch of 10 μm and lines at 10 and 100μm. Useful for calibration and image distortion checks in the 100x to 1000x magnification range.
6. Resolution Standard (Medium): Gold crystals 5-150nm on a carbon background which is useful for checking the performance of the SEM under high-resolution conditions i.e. finer than a 10 micron probe.
7. Resolution Standard (High): Gold crystals <3-50nm on a carbon background which is useful for checking the performance of the SEM under high-resolution conditions i.e. finer than a 10 micron probe.