Ultra-Flat Silicon Wafers
These ultra-flat wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer.
Specifications
|
4" |
6" |
8" |
Material: |
Silicon |
Silicon |
Silicon |
Diameter: |
100 mm |
150 mm |
200 mm |
Orientation: |
<100> |
<100> |
<100> |
Type/Dopant: |
P/Boron |
P/Boron |
P/Boron |
Grade: |
Prime/CZ Virgin |
Prime/CZ Virgin |
Prime/CZ Virgin |
Growth Method: |
CZ |
CZ |
CZ |
Resistivity: |
10-20 Ohm-cm |
10-20 Ohm-cm |
10-20 Ohm-cm |
Thickness: |
525 µm ±20 µm |
675 µm ±20 µm |
725 µm ±20 µm |
TTV: |
<4.00µm |
<4.00µm |
<4.00µm |
SFPD: |
<2.0µm |
<2.0µm |
<2.0µm |
Warp: |
≤30µm |
≤30µm |
≤30µm |
Bow: |
≤30µm |
≤30µm |
≤30µm |
Particles: |
≤[email protected]≥0.3 µm |
≤[email protected]≥0.3 µm |
≤[email protected]≥0.3 µm |
Front Surface: |
Polished |
Polished |
Polished |
Back Surface: |
Etched |
Etched |
Etched |
Flat: |
2 per SEMI Standard |
1 per SEMI Standard |
2 per SEMI Standard |
Site Flatness: |
<2.0 µm |
<2.0 µm |
<2.0 µm |
Roughness: |
Typically 2-3Å |
Typically 2-3Å |
Typically 2-3Å |