EMS maintains a wide selection of specimen holders and accessories, including those for scanning electron microscopy (SEM). focused ion beam (FIB), and scanning transmission electron microscopy (STEM) analysis. In general, specimen holders are the more complex mechanism that holds the specimen mount in position during imaging and can facilitate specific functions such as rotating, tilting, or adjusting the position of a specimen.
Distinct from standard SEM specimen holders and SEM stub holders, there are several specialized sample holders that offer unique functionality for imaging and analysis, including those designed for use in combined FIB-SEM instruments. FIB sample holders are used in the process of focused ion beam milling, cross-sectioning, and accessing specific areas of interest within the sample, which aids both the current analysis of that specimen as well as its potential preparation for further analysis such as transmission electron microscopy.
FIB sample holders are usually crafted from materials like stainless steel or tungsten, which are resistant to ion beam bombardment and harsh milling conditions. These sample holders also include primary features such as precision motorized stages, tilt and rotational abilities, and compatibility with SEM imaging.
Holds an FIB sample mounted on a standard 25 mm (1") pin stub for FIB milling and lift out procedures. Also holds TEM grids to mount the prepared lamellae on an FIB grid for TEM imaging. Vacuum grade aluminum with brass screws.
For clamping irregular, bulky samples. The opening is 15.9 mm wide x 25.4 mm long x 9.5 mm deep. Pin diameter is 3.2 mm. Made pf machined aluminum with stainless steel allen set screws. Allen wrench included.
Machined aluminum specimen holder for scanning electron microscopy. Opening is 32 mm wide x 32 mm long x 13 mm deep. Stainless steel allen set screws keep specimen in place. 3.2 mm pin.
Holds up to 2" specimens. Opening: 52 mm (2") wide x 40 mm (1 1/2") long x 13 mm ( 1/2") deep. Pin Diameter: 3.2 mm ( 1/8"). Material: Machined aluminum with stainless steel allen set screws. Allen wrench included.
Machined aluminum specimen holder for scanning electron microscopy holds up to 3" specimens. Opening is 80 mm wide x 48 mm long x 13 mm deep. Stainless steel allen set screws keep specimen in place. 3.2 mm pin.
Mini SEM Clamp on a standard 12.7 mm ( 1/2") pin stub. Suitable for holding flat or thin specimens such as silicon chips, foil, wires, and small tubes. Material: Vacuum-grade aluminum with brass screw.
SEM specimen holder has 15 mm long with 10 mm wide clamping area and standard pin stub 3.2 mm. Suitable for holding samples up to 7 mm overall thickness. Perfect for small tubes, strips, wires, and smaller flat samples.
Scanning electron microscope clamp for samples up to 7 mm overall thickness including small tubes, strips, wires, and smaller flat samples. Dimensions: 23 x 20 x 9 mm. Machined aluminum with brass screws.
SEM specimen clamp achieves background-free imaging and no contact with sample surface in imaging area with 5mm recessed clip. Clamping Area: 25 mm long x 15 mm wide.
Spring-loaded clips accommodate samples up to 2 mm thickness. Samples are held securely by small spring-loaded clips. Easy change of samples. Adhesives are not required.
Spring-loaded clips accommodate samples up to 2 mm thickness. Samples are held securely by small spring-loaded clips. Easy change of samples. Adhesives are not required.
This aluminum mount features an M4 threaded hole and is 25mm in dia. Copper clips. The mount comes complete with a Faraday Cup (2.5mm x 100nm hole) and a gold/carbon resolution sample 3mm in dia. is included. The gold particle size range is 5-150nm.
Aluminum Mini SEM clamp on a 10mm, 15mm diameter M4 cylinder mount. Convenient for holding flat or thin specimens such as silicon chips, wires, foil and small tubes. Screw is M2 x 3mm, pan head screw, brass.