EMS maintains a wide selection of specimen holders and accessories, including those for scanning electron microscopy (SEM). focused ion beam (FIB), and scanning transmission electron microscopy (STEM) analysis. In general, specimen holders are the more complex mechanism that holds the specimen mount in position during imaging and can facilitate specific functions such as rotating, tilting, or adjusting the position of a specimen. 

Distinct from standard SEM specimen holders and SEM stub holders, there are several specialized sample holders that offer unique functionality for imaging and analysis, including those designed for use in combined FIB-SEM instruments. FIB sample holders are used in the process of focused ion beam milling, cross-sectioning, and accessing specific areas of interest within the sample, which aids both the current analysis of that specimen as well as its potential preparation for further analysis such as transmission electron microscopy. 

FIB sample holders are usually crafted from materials like stainless steel or tungsten, which are resistant to ion beam bombardment and harsh milling conditions. These sample holders also include primary features such as precision motorized stages, tilt and rotational abilities, and compatibility with SEM imaging. 

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